About the job
About Us
At blacksemiconductor, we view the semiconductor industry as an expansive field of opportunities. Our mission is to revolutionize the industry with our innovative graphene solutions, making a significant impact on how technology connects the world. Join us in our journey to demonstrate that transformative change is possible through collaboration and a shared vision.
About Our Technology
As the semiconductor industry seeks high-performance chips with greater bandwidth and lower power consumption, our technology provides the key solution. We integrate chips into efficient, high-throughput computing networks, leveraging the unique properties of graphene to merge electronic computing with photonic communication. This innovation allows for unprecedented interaction among chips, enhancing computing efficiency and power dramatically. In essence, we create seamless and energy-efficient networks that dismantle current connectivity barriers.
The Role
We are on the lookout for a skilled Senior Device Reliability Testing Engineer to lead the reliability qualification, failure analysis, and accelerated life testing of our integrated graphene photonics products. You will collaborate closely with teams across Design Enablement, Process Integration, and Product Quality to develop robust methodologies that confirm device performance, packaging integrity, and long-term stability as per industry standards.
Your expertise will be crucial in transitioning our groundbreaking technology from prototype to production-ready products, ensuring our graphene photonics fulfill the performance and durability criteria essential for high-volume deployment.
Key Responsibilities
Design and implement wafer-level device and packaging reliability test plans for graphene-based electro-optic and photonic devices, including DC bias, RF endurance, thermal cycling, and long-term stability.
Characterize and monitor critical performance metrics such as extinction ratio, insertion loss, bandwidth retention, energy efficiency, dark current stability, responsivity degradation, and NEP drift throughout the device's lifecycle.
Lead high-speed reliability testing initiatives, ensuring compliance with established protocols and standards.

